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  Datasheet File OCR Text:
 Bulletin I0120J rev. A 02/97
IR180DM..CCB SERIES
STANDARD RECOVERY DIODES
Junction Size: Wafer Size: VRRM Class: Passivation Process:
Square 180 mils 4" 800 and 1200 V Glassivated MOAT
Reference IR Packaged Part: 20ETS Series
Major Ratings and Characteristics
Parameters
V FM V RRM Maximum Forward Voltage Reverse Breakdown Voltage Range
Units
1050 mV 800 and 1200 V
Test Conditions
T J = Amb., I F = 20 A T J = Amb., I RRM = 100 A
(1)
(1) Nitrogen flow on die edge.
Mechanical Characteristics
Nominal Back Metal Composition, Thickness Nominal Front Metal Composition, Thickness Chip Dimensions Wafer Diameter Wafer Thickness Maximum Width of Sawing Line Reject Ink Dot Size Ink Dot Location Recommended Storage Environment Cr - Ni - Ag (1 KA - 4 KA - 6 KA) 100% Al, (20 m) 180 x 180 mils (see drawing) 100 mm, with std. < 110 > flat 300 m 45 m 0.25 mm diameter minimum See drawing Storage in original container, in dessicated nitrogen, with no contamination
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1
IR180DM..CCB Series
Bulletin I0120J rev. A 02/97
Ordering Information Table
Device Code
IR
1 1 2 3 4 5 6 7 International Rectifier Device Chip Dimension in Mils
180
2
D
3
M
4
12
5
C
6
CB
7
Type of Device: D = Wire Bondable Standard Recovery Diode Passivation Process: M = Glassivated MOAT Voltage code: Code x 100 = VRRM Metallization: C = Aluminium (Anode) - Silver (Cathode) CB = Probed Uncut Die (wafer in box)
Available Class 08 = 800 V 12 = 1200 V
None = Probed Die in chip carrier
Outline Table
All dimensions are in microns (mils)
2
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IR180DM..CCB Series
Bulletin I0120J rev. A 02/97
Wafer Layout
TOP VIEW N 293 Basic Cells
All dimensions are in millimeters
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